Our experienced staff makes full use of advanced inspection equipment and evaluation equipment to guarantee technology and quality.
* For devices and equipment with a link, see photos by clicking their names.
| Equipment name | Manufacturer | Model | Quantity |
|---|---|---|---|
| FE-SEM/EDX (field-emission scanning electron microscope/energy dispersive X-ray microanalyzer) |
Hitachi High-Technologies Corporation Horiba, Ltd. |
S-4800/EX-350 | 1 |
| FIB (focused ion beam system) | Hitachi High-Technologies Corporation | FB-2100 | 1 |
| Microscope | Keyence Corporation | VHX-5000 | 1 |
| Color 3D laser microscope | Olympus Corporation | OLS5100 | 1 |
| Measuring microscope | Nikon Corporation | MM-11 | 1 |
| Stereo microscope | Leica Microsystems GmbH | S8AP0 | 1 |
| CP (cross Section Polisher) | JEOL Ltd. | SM09010 | 1 |
| Ion sputter | Hitachi High-Technologies Corporation | E-1010 | 1 |
| Microtome | Leica Microsystems GmbH | RM2265 | 1 |
| Precision cut-off machine | Marumoto Struers K.K. | Auccutom-50 | 1 |
| Grinding machine | Marumoto Struers K.K. | TegraPol-11 | 1 |
| Vacuum impregnation unit | Marumoto Struers K.K. | Epovac | 1 |
| Equipment name | Manufacturer | Model | Quantity |
|---|---|---|---|
| Autograph | Shimadzu Corporation | AGS-X | 1 |
| Electrical contact simulator | Yamasaki Seiki Kenkyusho Inc. | CRS-1 | 1 |
| Loresta resistivity meter | Mitsubishi Chemical Analytech Co., Ltd. | MCP-T700 | 1 |
| Nano particle size analyzer | Shimadzu Corporation | SALD-7100 | 1 |
| Fine shape measuring machine | Kosaka Laboratory Ltd. | ET200 | 1 |
| X-ray fluorescence coating thickness gauge | FISCHER INSTRUMENTS K.K. | XDLM237 | 2 |
| XDV-μ | 1 | ||
| Micro Vickers hardness testing machine | Mitsutoyo Corporation | HM-124 | 1 |
| Surface roughness tester | Mitsutoyo Corporation | SJ-301 | 1 |
| Gloss meter | Nippon Denshoku Industries Co., Ltd. | ND-11 | 1 |
| Solder checker | Rhesca Corporation | SAT-5200 | 1 |
| Solder wettability testing apparatu | Japan Unix Co., Ltd. | UF-701D | 1 |
| ICP emission spectrometer | Shimadzu Corporation | ICPS-7510 | 1 |
| Atomic absorption spectrometer | Hitachi High-Technologies Corporation | Z-5310 | 1 |
| Ultraviolet absorptiometer | Shimadzu Corporation | UV-1600PC | 1 |
| Capillary electrophoresis system | Otsuka Electronics Co., Ltd. | G-7100A | 1 |
| CVS (cyclic voltammetric stripping) | Metrohm AG | 894 | 1 |
| Equipment name | Manufacturer | Model | Quantity |
|---|---|---|---|
| Mixed flowing gas corrosion test cabinet | Yamasaki Seiki Kenkyusho Inc. | GLP-91 | 1 |
| Salt spray test instrument | Suga Test Instruments Co., Ltd. | CAP-90 | 1 |
| Highly accelerated life testing device | Espec Corp. | EHS-411M | 1 |
| Thermal shock chamber | Hitachi Appliances, Inc. | ES-56L | 1 |
| Constant climate cabinet | Espec Corp. | PH-1KT | 1 |
| Elevator-hearth muffle furnace | Marusho Denki Co., Ltd. | MNCDQ0043 | 1 |
* For devices and equipment with a link, see photos by clicking their names.
| Equipment name | Manufacturer | Model | Quantity |
|---|---|---|---|
| SEM/EDX/EBSD (scanning electron microscope/energy dispersive X-ray microanalyzer/backscattered electron diffraction pattern) |
Hitachi High-Technologies Corporation Horiba, Ltd. TSL Solutions Ltd. |
S-3000H/EX-250/OIM | 1 |
| Microscope | Keyence Corporatio | VHX-900 | 1 |
| Wet precision cut-off machine | Refine Tec Ltd. | R00-971 | 1 |
| Equipment name | Manufacturer | Model | Quantity |
|---|---|---|---|
| X-ray fluorescence coating thickness gauge | FISCHER INSTRUMENTS K.K. | XDLM237 | 1 |
| Hitachi High-Tech Science Corporation | FT160S | 1 | |
| Micro Vickers hardness testing machine | Mitsutoyo Corporation | HM-220A | 1 |
| Solder checker | Rhesca Corporation | SAT-5200 | 1 |
| Atomic absorption spectrometer | Hitachi High-Technologies Corporation | ZA3000 | 1 |
| Ultraviolet absorptiometer | Shimadzu Corporation | UV-1600PC | 1 |
